我search了互联网find一个工具/实用程序，可以告诉我执行的SSD（或普通磁盘）的总写入。 输出应该是这样的：
SSD Intel 320S :- Total data written until now -- 2Tb Total data read until now -- 4Tb power on Hours -- 1234 Hrs etc. 但是我还没有find。 有谁知道这样的工具？
我知道在Windows上的SSDLife工具做到这一点，但我特别希望在Linux上这样做。
我从smartmontoolsbuild议的smartctl查找了smartctl命令。 他的post非常有帮助。 我将在这里添加更多信息，这是我在挖掘互联网后遇到的。
我发现gsmartcontrol （gui版本的smartctrl ）特别有帮助。 有关这些工具类的更多信息，请查看Smartmontools – 社区Ubuntu文档 。 这个链接有smartctl例子。
了解每个SMART属性意味着检查此英特尔SMART属性 。 这些属性是特定于英特尔固态硬盘的，但是提供了一个想法，即SMART属性传达了什么样的信息。 一些特定的参数可能会在不同的SSD之间不同。 LBA是其中之一吗？我不知道。
另一个很好的信息来源是如何确定在Linux下SSD的写入周期数或预期寿命？ – 服务器故障 。 在这里，最好的答案是SMART Attribute Id 225表示直到现在为SSD执行的总大小为32MiB的写入I / O。 但是，这适用于Intel X25-M。 其他SSD可能会使用其他SMART属性来传输写入磁盘的总数据。
特别是，对于三星840 Pro（甚至可能是其他三星固态硬盘？） SMART Attribute Id 241 -- Total LBAs Written传达此信息。 我的LBA大小的猜测是512字节，但我不确定？ 我通过将一定数量的数据写入SSD并测量此属性的值来运行一些实验，表明它是512字节。
这个值在SMART属性中保存。 您可以使用smartctl命令来获取它们。
你可以试试
# smartctl -a /dev/sda smartctl -a /dev/sda smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-49-generic] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: INTEL SSDSC2CW180A3 Serial Number: CVCV204408A6180EGN LU WWN Device Id: 5 001517 bb2824682 Firmware Version: 400i User Capacity: 180,045,766,656 bytes [180 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ACS-2 revision 3 Local Time is: Thu Jul 11 00:55:16 2013 PDT SMART support is: Available – device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0×00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2097) seconds. Offline data collection capabilities: (0x7f) SMART execute Offline immediate. Auto Offline data collection on/off support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0×0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0×01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0×0021) SCT Status supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0×0032 100 100 000 Old_age Always – 0 9 Power_On_Hours 0×0032 000 000 000 Old_age Always – 46385647693103 12 Power_Cycle_Count 0×0032 100 100 000 Old_age Always – 279 170 Unknown_Attribute 0×0033 100 100 010 Pre-fail Always – 0 171 Unknown_Attribute 0×0032 100 100 000 Old_age Always – 0 172 Unknown_Attribute 0×0032 100 100 000 Old_age Always – 0 174 Unknown_Attribute 0×0032 100 100 000 Old_age Always – 278 184 End-to-End_Error 0×0033 100 100 090 Pre-fail Always – 0 187 Reported_Uncorrect 0×0032 100 100 000 Old_age Always – 0 192 Power-Off_Retract_Count 0×0032 100 100 000 Old_age Always – 278 225 Load_Cycle_Count 0×0032 100 100 000 Old_age Always – 10754 226 Load-in_Time 0×0032 100 100 000 Old_age Always – 65535 227 Torq-amp_Count 0×0032 100 100 000 Old_age Always – 66 228 Power-off_Retract_Count 0×0032 100 100 000 Old_age Always – 65535 232 Available_Reservd_Space 0×0033 100 100 010 Pre-fail Always – 0 233 Media_Wearout_Indicator 0×0032 100 100 000 Old_age Always – 0 241 Total_LBAs_Written 0×0032 100 100 000 Old_age Always – 10754 242 Total_LBAs_Read 0×0032 100 100 000 Old_age Always – 21803 249 Unknown_Attribute 0×0013 100 100 000 Pre-fail Always – 357 SMART Error Log not supported SMART Self-test Log not supported Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0×0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
要比其他的更具体一些，你可以用-l devstat参数从smartctl获取这个信息。
示例输出：
Device Statistics (GP Log 0x04) Page Offset Size Value Description 1 ===== = = == General Statistics (rev 1) == 1 0x008 4 288 Lifetime Power-On Resets 1 0x018 6 348307315343 Logical Sectors Written 1 0x020 6 34309409 Number of Write Commands 1 0x028 6 3434309403 Logical Sectors Read 1 0x030 6 34954859 Number of Read Commands 4 ===== = = == General Errors Statistics (rev 1) == 4 0x008 4 0 Number of Reported Uncorrectable Errors 4 0x010 4 0 Resets Between Cmd Acceptance and Completion 5 ===== = = == Temperature Statistics (rev 1) == 5 0x008 1 13 Current Temperature 5 0x010 1 16 Average Short Term Temperature 5 0x018 1 25 Average Long Term Temperature 5 0x020 1 34 Highest Temperature 5 0x028 1 12 Lowest Temperature 5 0x030 1 35 Highest Average Short Term Temperature 5 0x038 1 16 Lowest Average Short Term Temperature 5 0x040 1 26 Highest Average Long Term Temperature 5 0x048 1 21 Lowest Average Long Term Temperature 5 0x050 4 0 Time in Over-Temperature 5 0x058 1 55 Specified Maximum Operating Temperature 5 0x060 4 0 Time in Under-Temperature 5 0x068 1 0 Specified Minimum Operating Temperature 6 ===== = = == Transport Statistics (rev 1) == 6 0x008 4 224211 Number of Hardware Resets 6 0x010 4 463 Number of ASR Events 6 0x018 4 0 Number of Interface CRC Errors 7 ===== = = == Solid State Device Statistics (rev 1) == 7 0x008 1 3 Percentage Used Endurance Indicator