我跑得很快，出现了一些奇怪的错误，虽然磁盘相当新鲜Power_On_Minutes 427h + 41m
我很好奇，这些是以前的硬盘的错误吗？
Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours) When the command that caused the error occurred, the device was active or idle Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours) When the command that caused the error occurred, the device was active or idle. 这是输出
# smartctl --all /dev/sda smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-51-generic] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Toshiba 2.5" HDD MK..76GSX Device Model: TOSHIBA MK2576GSX Serial Number: Y1J9S0IGS LU WWN Device Id: 5 000039 3a5a06b8e Firmware Version: GS001A User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Thu Dec 1 00:28:22 2016 GMT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 81) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1229 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 15 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Minutes 0x0032 036 036 000 Old_age Always - 427h+41m 10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1 193 Load_Cycle_Count 0x0032 070 070 000 Old_age Always - 304324 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 27 (Min/Max 20/31) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2 220 Disk_Shift 0x0002 100 100 000 Old_age Always - 109 222 Loaded_Hours 0x0032 067 067 000 Old_age Always - 13230 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 226 Load-in_Time 0x0026 100 100 000 Old_age Always - 375 240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 01 1f 7a 05 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00057a1f = 358943 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 00 00 20 76 05 e0 00 6d+01:49:26.915 WRITE DMA EXT 35 00 00 00 72 05 e0 00 6d+01:49:26.741 WRITE DMA EXT 35 00 08 80 0f 0c e0 00 6d+01:49:26.741 WRITE DMA EXT 35 00 08 48 8a c4 e0 00 6d+01:49:26.741 WRITE DMA EXT ca 00 08 00 08 14 e9 00 6d+01:49:26.741 WRITE DMA Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 01 3f 8c 4e e0 Error: ICRC, ABRT 1 sectors at LBA = 0x004e8c3f = 5147711 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 35 00 00 40 88 4e e0 00 12d+21:23:20.732 WRITE DMA EXT ca 00 08 a8 48 c8 e3 00 12d+21:23:20.731 WRITE DMA 35 00 08 40 c1 1d e0 00 12d+21:23:20.731 WRITE DMA EXT 35 00 08 b0 19 14 e0 00 12d+21:23:20.731 WRITE DMA EXT 35 00 10 28 bf 13 e0 00 12d+21:23:20.731 WRITE DMA EXT SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
此硬盘可能会很快失败，需要更换？
当您轮询SMART数据时，您并不是从caching中获取，而是直接从驱动器获取。 它永远不会显示你的旧驱动器的结果。 在这种情况下，你的驱动器正在失败，现在是时候去查看了。
另一方面，我甚至没有看到任何东西，甚至远程暗示磁盘正在下降。 在计数器中没有常见的死磁盘症状，例如：
Reallocated_Event_Count - 0 Current_Pending_Sector - 0 Offline_Uncorrectable - 0 但是你却看到了这个：
UDMA_CRC_Error_Count - 2 我不会为此而烦恼的。 循环冗余校验 （ Cyclic Redundancy Check ，CRC）是数据发送后进行校验和校正的一种方法。 这个警告告诉你的是，在某一点上，驱动器发送/接收的数据不能通过检查。 最常见的原因是电缆或磁盘控制器故障。 噪音或阻力可能会导致一些翻转。